The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...
Palo Alto, Calif.—Automatic test equipment maker Agilent Technologies now has a new final-test memory tester targeting MCP s (multi-chip packages) and discrete flash. Dubbed the Versatest Series Model ...
Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.
Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...
Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...
Introspect Technology is a member of JEDEC, the body that covers memory -- including the next-gen GDDR7 memory standard -- with Introspect shipping the world's first GDDR7 memory test system. The just ...
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